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Published 2007-11-14 Published on SciPeople2009-07-02 11:58:06 JournalProceedings of the Sixth International Conference on the Computer-aided design of discrete devices (CAD DD'2007)

Hybrid symbolic-genetic approach to test pattern generation for digital logic circuits

A.V. Borisevich and V.G. Novoselov / Алексей Борисевич

Abstract A genetic tests synthesis algorithm for the synchronous digital circuits, based on solving the integer optimization problem with a scalar objective function is presented. A decomposition strategy of the circuit under test and symbolic representation of its fragments obtained. New objective function with a global optimum which is the test sequence developed. Experimental results confirmed the effectiveness and practical applicability of the method.